Eri Widianto, Bhisma Mahendra, Muhammad Riswan, Frendy Jaya Kusuma, Kardiman, Eka Nurfani, Indra Pardede, Natalita Maulani Nursam, Kuwat Triyana, Iman Santoso
Optimizing light collection is essential to enhance power conversion efficiency in perovskite solar cells (PSCs). Understanding the optical characteristics of perovskite materials is key to designing improved structures and enhancing device performance. Precise characterization of these optical properties, especially in complex, multi-layered systems, is crucial. Spectroscopic ellipsometry (SE) is a vital technique for analyzing thin films. It provides insights into optical constants such as the dielectric function, refractive index, and absorption coefficient. SE is commonly used to study perovskite thin films, focusing on aspects such as optical model generation and data analysis, temperature-dependent behavior, thermal degradation, and the chemical composition of perovskites, all of which critically affect the performance and stability of solar cell devices. This review discusses recent progress in SE-based techniques as an effective tool for thoroughly and systematically evaluating the optoelectronic properties of perovskite thin films. Specifically, this review examines the analytical approaches for analyzing the perovskite properties, selecting theoretical optical models and data fitting methods, extracting key optical constants, and interpreting SE measurements. Further, the current advancement and prospects in using SE for optimizing the performance and stability of PSCs are discussed, which serve as critical points in accelerating the commercialization of PSCs in the future. © 2025 Vietnam National University, Hanoi
Department of Physics, Faculty of Engineering, Universitas Singaperbangsa Karawang, Telukjambe Timur, Karawang, 41361, Indonesia; Advanced Materials Laboratory, Integrated Laboratory (UPA) Kampus 2, Universitas Singaperbangsa Karawang, Karawang, 41351, Indonesia; Department of Physics, Faculty of Mathematics and Natural Sciences, Universitas Gadjah Mada, Sekip Utara PO Box BLS 21, Yogyakarta, 55281, Indonesia; Department of Mechanical Engineering, Faculty of Engineering, Universitas Singaperbangsa Karawang, Telukjambe Timur, Karawang, 41361, Indonesia; Department of Materials Engineering, Faculty of Industrial Technology, Institut Teknologi Sumatera, Lampung, 35365, Indonesia; Department of Physics, Faculty of Science, Institut Teknologi Sumatera, Lampung, 35365, Indonesia; Research Center for Electronics, National Research and Innovation Agency (BRIN), KST Samaun Samadikun, Jl. Sangkuriang Cisitu, Bandung, 40135, Indonesia